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    • Contact Probes for Sensors, Switches

    Contact probes are a type of pin-shaped probe used for continuity testing of electronic circuits. They are composed of a plunger (movable part), barrel (body) and spring. They are often used at sites requiring continuity in tens to hundreds of circuits in ICs, electronic parts and other semiconductor devices and circuit boards. The plungers that form the tip of a contact probe come in various designs such as needle, flat and spherical (SR). They include gold-plated models with superior conductivity, and palladium alloy models not requiring plating. Selecting the right plunger tip shape is important when selecting a contact probe. And since the plunger conveys an electrical signal just by making contact with the test point, the selection of factors such as contact resistance, spring force, stroke and size (diameter and length) is also important. When a contact probe needs to be replaced due to tip wear, it can be replaced just by removing the old probe and inserting a new one.
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